Download PDF by Bharat Bhushan, Harald Fuchs: Applied Scanning Probe Methods II: Scanning Probe Microscopy

By Bharat Bhushan, Harald Fuchs

ISBN-10: 3540262423

ISBN-13: 9783540262428

Volumes II, III and IV research the actual and technical beginning for fresh growth in utilized near-field scanning probe concepts, and construct upon the 1st quantity released in early 2004. the sector is progressing so speedy that there's a want for a moment set of volumes to trap the newest advancements. It constitutes a well timed accomplished assessment of SPM purposes, now that business functions span topographic and dynamical floor reviews of thin-film semiconductors, polymers, paper, ceramics, and magnetic and organic fabrics. quantity II introduces scanning probe microscopy, together with sensor expertise, quantity III covers the complete diversity of characterization percentages utilizing SPM and quantity IV deals chapters on makes use of in a number of commercial functions. The foreign viewpoint provided in those 3 volumes - which belong jointly - contributes additional to the evolution of SPM thoughts.

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Extra resources for Applied Scanning Probe Methods II: Scanning Probe Microscopy Techniques (NanoScience and Technology) (v. 2)

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327 The Science of Beauty on a Small Scale. Nanotechnologies Applied to Cosmetic Science Gustavo Luengo, Frédéric Leroy . . . . . . . . . . 363 Part III Industrial Applications 13 14 15 16 SPM Manipulation and Modifications and Their Storage Applications Sumio Hosaka . . . . . . . . . . . . . . . 389 Super Density Optical Data Storage by Near-Field Optics Jun Tominaga . . . . . . . . . . . . . . . 429 Capacitance Storage Using a Ferroelectric Medium and a Scanning Capacitance Microscope (SCM) Ryoichi Yamamoto .

The relative frequency shift of the higher eigenmodes is of course smaller than that of the fundamental mode because the frequency shift depends upon the stiffness ratio kˆ ts /m ωˆ 2n , which rapidly decreases with an increasing mode number n. For a very stiff tip–sample contact with kˆ ts = 105 , the system approximately corresponds to a cantilever with its end pinned to the sample surface (Fig. 4). The resonant frequencies of the stiff system – seen in the light lever output (2) – correspond to the frequencies of the transmission minima of the displacement output of the free system.

429 Capacitance Storage Using a Ferroelectric Medium and a Scanning Capacitance Microscope (SCM) Ryoichi Yamamoto . . . . . . . . . . . . . . 439 Room-Temperature Single-Electron Devices formed by AFM Nano-Oxidation Process Kazuhiko Matsumoto . . . . . . . . . . . . . 459 Subject Index . . . . . . . . . . . . . . . . . . . . . . . . . . O. de Paul Girard LAIN, UMR CNRS 5011, CC 082, Université de Montpellier II Place E. fr XXXIV List of Contributors – Volume II Hermann Gruber Institute for Biophysics, J.

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Applied Scanning Probe Methods II: Scanning Probe Microscopy Techniques (NanoScience and Technology) (v. 2) by Bharat Bhushan, Harald Fuchs


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